Erik Jan Marinissen, Ferenc Fodor, Bart De Wachter, Jorg Kiesewetter, Eric Hill, Ken Smith. A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards. In International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017. pages 144-149, IEEE, 2017. [doi]
Abstract is missing.