External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

IV, noise and electroluminescence analysis of stress-induced percolation paths in AlGaN/GaN high electron mobility transistors

P. Marko, Matteo Meneghini, Sergey Bychikhin, D. Marcon, Gaudenzio Meneghesso, Enrico Zanoni, Dionyz Pogany. IV, noise and electroluminescence analysis of stress-induced percolation paths in AlGaN/GaN high electron mobility transistors. Microelectronics Reliability, 52(9-10):2194-2199, 2012. [doi]

Authors

P. Marko

This author has not been identified. Look up 'P. Marko' in Google

Matteo Meneghini

This author has not been identified. Look up 'Matteo Meneghini' in Google

Sergey Bychikhin

This author has not been identified. Look up 'Sergey Bychikhin' in Google

D. Marcon

This author has not been identified. Look up 'D. Marcon' in Google

Gaudenzio Meneghesso

This author has not been identified. Look up 'Gaudenzio Meneghesso' in Google

Enrico Zanoni

This author has not been identified. Look up 'Enrico Zanoni' in Google

Dionyz Pogany

This author has not been identified. Look up 'Dionyz Pogany' in Google
runs on