Comparative analysis of differential colpitts and cross-coupled VCOs in 180 nm Si-Ge HBT technology - researchr publication authors

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Valerio Marotta, Giuseppe Macera, Michael Peter Kennedy, Ettore Napoli. Comparative analysis of differential colpitts and cross-coupled VCOs in 180 nm Si-Ge HBT technology. In IEEE International Symposium on Circuits and Systems, ISCAS 2016, Montréal, QC, Canada, May 22-25, 2016. pages 1650-1653, IEEE, 2016. [doi]

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