The importance of benchmarking for charge-based and beyond CMOS devices

Andrew Marshall, Nishtha Sharma. The importance of benchmarking for charge-based and beyond CMOS devices. In Massimo Alioto, Hai Helen Li, Jürgen Becker, Ulf Schlichtmann, Ramalingam Sridhar, editors, 30th IEEE International System-on-Chip Conference, SOCC 2017, Munich, Germany, September 5-8, 2017. pages 1-2, IEEE, 2017. [doi]

Abstract

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