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Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs

J. Martín-Martínez, Simone Gerardin, R. Rodríguez, M. Nafría, X. Aymerich, A. Cester, Alessandro Paccagnella, G. Ghidini. Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs. Microelectronics Reliability, 47(9-11):1349-1352, 2007. [doi]

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J. Martín-Martínez

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Simone Gerardin

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R. Rodríguez

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M. Nafría

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X. Aymerich

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A. Cester

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Alessandro Paccagnella

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G. Ghidini

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