Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs

J. Martín-Martínez, Simone Gerardin, R. Rodríguez, M. Nafría, X. Aymerich, A. Cester, Alessandro Paccagnella, G. Ghidini. Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs. Microelectronics Reliability, 47(9-11):1349-1352, 2007. [doi]

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