Javier Martín-Martínez, Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández 0001, Montserrat Nafría. Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-9, IEEE, 2023. [doi]
Abstract is missing.