Characterization of ageing failures on power MOSFET devices by electron and ion microscopies

D. Martineau, T. Mazeaud, M. Legros, Ph. Dupuy, C. Levade, G. Vanderschaeve. Characterization of ageing failures on power MOSFET devices by electron and ion microscopies. Microelectronics Reliability, 49(9-11):1330-1333, 2009. [doi]

Abstract

Abstract is missing.