Ph. Dupuy - researchr alias

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Viewing Publication 1 - 6 from 6

2013

Reliability of power MOSFET-based smart switches under normal and extreme conditions for 24 V battery system applicationsG. Rostaing, Mounira Berkani, D. Mechouche, D. Labrousse, Stéphane Lefebvre, Zoubir Khatir, Ph. Dupuy. mr, 53(9-11):1703-1706, 2013. [doi]

2010

Characterization of alterations on power MOSFET devices under extreme electro-thermal fatigueD. Martineau, T. Mazeaud, M. Legros, Ph. Dupuy, C. Levade. mr, 50(9-11):1768-1772, 2010. [doi]

2009

Characterization of ageing failures on power MOSFET devices by electron and ion microscopiesD. Martineau, T. Mazeaud, M. Legros, Ph. Dupuy, C. Levade, G. Vanderschaeve. mr, 49(9-11):1330-1333, 2009. [doi]

2007

Characterization and modelling of ageing failures on power MOSFET devicesB. Khong, M. Legros, P. Tounsi, Ph. Dupuy, X. Chauffleur, C. Levade, G. Vanderschaeve, E. Scheid. mr, 47(9-11):1735-1740, 2007. [doi]

2005

Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal FatigueB. Khong, P. Tounsi, Ph. Dupuy, X. Chauffleur, M. Legros, A. Deram, C. Levade, G. Vanderschaeve, J. M. Dorkel, J. P. Fradin. mr, 45(9-11):1717-1722, 2005. [doi]

2001

Power module lifetime estimation from chip temperature direct measurement in an automotive traction inverterGerard Coquery, S. Carubelli, J. P. Ousten, Richard Lallemand, Frederic Lecoq, Dominique Lhotellier, V. de Viry, Ph. Dupuy. mr, 41(9-10):1695-1700, 2001. [doi]

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