Reliability of power MOSFET-based smart switches under normal and extreme conditions for 24 V battery system applications

G. Rostaing, Mounira Berkani, D. Mechouche, D. Labrousse, Stéphane Lefebvre, Zoubir Khatir, Ph. Dupuy. Reliability of power MOSFET-based smart switches under normal and extreme conditions for 24 V battery system applications. Microelectronics Reliability, 53(9-11):1703-1706, 2013. [doi]

Abstract

Abstract is missing.