G. Rostaing, Mounira Berkani, D. Mechouche, D. Labrousse, Stéphane Lefebvre, Zoubir Khatir, Ph. Dupuy. Reliability of power MOSFET-based smart switches under normal and extreme conditions for 24 V battery system applications. Microelectronics Reliability, 53(9-11):1703-1706, 2013. [doi]
@article{RostaingBMLLKD13,
title = {Reliability of power MOSFET-based smart switches under normal and extreme conditions for 24 V battery system applications},
author = {G. Rostaing and Mounira Berkani and D. Mechouche and D. Labrousse and Stéphane Lefebvre and Zoubir Khatir and Ph. Dupuy},
year = {2013},
doi = {10.1016/j.microrel.2013.07.120},
url = {http://dx.doi.org/10.1016/j.microrel.2013.07.120},
researchr = {https://researchr.org/publication/RostaingBMLLKD13},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {53},
number = {9-11},
pages = {1703-1706},
}