Modeling and Evaluation of Substrate Noise Induced by Interconnects

Ferran Martorell, Diego Mateo, Xavier Aragonès. Modeling and Evaluation of Substrate Noise Induced by Interconnects. In 2003 Design, Automation and Test in Europe Conference and Exposition (DATE 2003), 3-7 March 2003, Munich, Germany. pages 10524-10529, IEEE Computer Society, 2003. [doi]

Abstract

Abstract is missing.