DCG-FGT transistor: Retention study of Floating Gate charge

A. Marzaki, V. Bidal, Romain Laffont, Wenceslas Rahajandraibe, Jean Michel Portal, Rachid Bouchakour. DCG-FGT transistor: Retention study of Floating Gate charge. In IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013, Columbus, OH, USA, August 4-7, 2013. pages 825-827, IEEE, 2013. [doi]

Authors

A. Marzaki

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V. Bidal

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Romain Laffont

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Wenceslas Rahajandraibe

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Jean Michel Portal

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Rachid Bouchakour

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