Yield and power improvement method by post-silicon delay tuning and technology mapping - researchr publication authors

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Hayato Mashiko, Yukihide Kohira. Yield and power improvement method by post-silicon delay tuning and technology mapping. In 2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016, Jeju, South Korea, October 25-28, 2016. pages 366-369, IEEE, 2016. [doi]

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