Hayato Mashiko, Yukihide Kohira. Yield and power improvement method by post-silicon delay tuning and technology mapping. In 2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016, Jeju, South Korea, October 25-28, 2016. pages 366-369, IEEE, 2016. [doi]
@inproceedings{MashikoK16,
title = {Yield and power improvement method by post-silicon delay tuning and technology mapping},
author = {Hayato Mashiko and Yukihide Kohira},
year = {2016},
doi = {10.1109/APCCAS.2016.7803977},
url = {http://dx.doi.org/10.1109/APCCAS.2016.7803977},
researchr = {https://researchr.org/publication/MashikoK16},
cites = {0},
citedby = {0},
pages = {366-369},
booktitle = {2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016, Jeju, South Korea, October 25-28, 2016},
publisher = {IEEE},
isbn = {978-1-5090-1570-2},
}