N. Torres Matabosch, M. Kaynak, F. Coccetti, M. Wietstruck, Bernd Tillack, J. L. Cazaux. Estimation of RF performance from LF measurements: Towards the design for reliability in RF-MEMS. Microelectronics Reliability, 52(9-10):2310-2313, 2012. [doi]
Abstract is missing.