Sotirios Matakias, Yiorgos Tsiatouhas, Angela Arapoyanni, Th. Haniotakis, Guillaume Prenat, Salvador Mir. DDQ testing circuit. In Laurent Fesquet, Andreas Kaiser, Sorin Cristoloveanu, Michel Brillouët, editors, Proceedings of the 31st European Solid-State Circuits Conference, ESSCIRC 2005, Grenoble, France, 12-16 September 2005. pages 471-474, IEEE, 2005. [doi]
Abstract is missing.