Donatello Materassi, Murti V. Salapaka, M. Basso. Identification of Interaction Potentials in Dynamic Mode Atomic Force Microscopy. In 45th IEEE Conference on Decision and Control, CDC 2006, San Diego, CA, USA, 13-15 December, 2006. pages 3702-3705, IEEE, 2006. [doi]
Abstract is missing.