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Deepak Mathaikutty, Sandeep K. Shukla, Sreekumar V. Kodakara, David J. Lilja, Ajit Dingankar. Design fault directed test generation for microprocessor validation. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 761-766, ACM, 2007. [doi]

This author has not been identified. Look up 'Deepak Mathaikutty' in GoogleThis author has not been identified. Look up 'Sandeep K. Shukla' in GoogleThis author has not been identified. Look up 'Sreekumar V. Kodakara' in GoogleThis author has not been identified. It may be one of the following persons:

David J. Lilja

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