Deepak Mathaikutty, Sandeep K. Shukla, Sreekumar V. Kodakara, David J. Lilja, Ajit Dingankar. Design fault directed test generation for microprocessor validation. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 761-766, ACM, 2007. [doi]
@inproceedings{MathaikuttySKLD07,
title = {Design fault directed test generation for microprocessor validation},
author = {Deepak Mathaikutty and Sandeep K. Shukla and Sreekumar V. Kodakara and David J. Lilja and Ajit Dingankar},
year = {2007},
doi = {10.1145/1266366.1266529},
url = {http://doi.acm.org/10.1145/1266366.1266529},
tags = {testing, design},
researchr = {https://researchr.org/publication/MathaikuttySKLD07},
cites = {0},
citedby = {0},
pages = {761-766},
booktitle = {2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France},
editor = {Rudy Lauwereins and Jan Madsen},
publisher = {ACM},
isbn = {978-3-9810801-2-4},
}