Jimson Mathew, Marco Ottavi, Yunfan Yang, Dhiraj K. Pradhan. Using memristor state change behavior to identify faults in photovoltaic arrays. In 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014. pages 86-91, IEEE, 2014. [doi]
Abstract is missing.