Deepak M. Mathew, Martin Schultheis, Carl Christian Rheinländer, Chirag Sudarshan, Christian Weis, Norbert Wehn, Matthias Jung 0001. An analysis on retention error behavior and power consumption of recent DDR4 DRAMs. In 2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018. pages 293-296, IEEE, 2018. [doi]
@inproceedings{MathewSRSWW018,
title = {An analysis on retention error behavior and power consumption of recent DDR4 DRAMs},
author = {Deepak M. Mathew and Martin Schultheis and Carl Christian Rheinländer and Chirag Sudarshan and Christian Weis and Norbert Wehn and Matthias Jung 0001},
year = {2018},
doi = {10.23919/DATE.2018.8342023},
url = {https://doi.org/10.23919/DATE.2018.8342023},
researchr = {https://researchr.org/publication/MathewSRSWW018},
cites = {0},
citedby = {0},
pages = {293-296},
booktitle = {2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018},
publisher = {IEEE},
isbn = {978-3-9819263-0-9},
}