Deepak M. Mathew, Martin Schultheis, Carl Christian Rheinländer, Chirag Sudarshan, Christian Weis, Norbert Wehn, Matthias Jung 0001. An analysis on retention error behavior and power consumption of recent DDR4 DRAMs. In 2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018. pages 293-296, IEEE, 2018. [doi]
No references recorded for this publication.
No citations of this publication recorded.