Mohamed Matmat, Fabio Coccetti, Antoine Marty, Robert Plana, Christophe Escriba, Jean-Yves Fourniols, Daniel Estève. Capacitive RF MEMS analytical predictive reliability and lifetime characterization. Microelectronics Reliability, 49(9-11):1304-1308, 2009. [doi]
@article{MatmatCMPEFE09,
title = {Capacitive RF MEMS analytical predictive reliability and lifetime characterization},
author = {Mohamed Matmat and Fabio Coccetti and Antoine Marty and Robert Plana and Christophe Escriba and Jean-Yves Fourniols and Daniel Estève},
year = {2009},
doi = {10.1016/j.microrel.2009.06.049},
url = {http://dx.doi.org/10.1016/j.microrel.2009.06.049},
tags = {reliability},
researchr = {https://researchr.org/publication/MatmatCMPEFE09},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {49},
number = {9-11},
pages = {1304-1308},
}