The following publications are possibly variants of this publication:
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- Life expectancy and characterization of capacitive RF MEMS switchesMohamed Matmat, K. Koukos, Fabio Coccetti, T. Idda, Antoine Marty, Christophe Escriba, Jean-Yves Fourniols, Daniel Estève. mr, 50(9-11):1692-1696, 2010. [doi]