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Life expectancy and characterization of capacitive RF MEMS switches

Mohamed Matmat, K. Koukos, Fabio Coccetti, T. Idda, Antoine Marty, Christophe Escriba, Jean-Yves Fourniols, Daniel Estève. Life expectancy and characterization of capacitive RF MEMS switches. Microelectronics Reliability, 50(9-11):1692-1696, 2010. [doi]

Authors

Mohamed Matmat

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K. Koukos

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Fabio Coccetti

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T. Idda

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Antoine Marty

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Christophe Escriba

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Jean-Yves Fourniols

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Daniel Estève

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