Mohamed Matmat, K. Koukos, Fabio Coccetti, T. Idda, Antoine Marty, Christophe Escriba, Jean-Yves Fourniols, Daniel Estève. Life expectancy and characterization of capacitive RF MEMS switches. Microelectronics Reliability, 50(9-11):1692-1696, 2010. [doi]
@article{MatmatKCIMEFE10,
title = {Life expectancy and characterization of capacitive RF MEMS switches},
author = {Mohamed Matmat and K. Koukos and Fabio Coccetti and T. Idda and Antoine Marty and Christophe Escriba and Jean-Yves Fourniols and Daniel Estève},
year = {2010},
doi = {10.1016/j.microrel.2010.07.064},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.064},
researchr = {https://researchr.org/publication/MatmatKCIMEFE10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {9-11},
pages = {1692-1696},
}