Test Generation for Single and Multiple Stuck-at Faults of a Combinational Circuit Designed by Covering Shared ROBDD with CLBs - researchr publication authors

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Anjela Matrosova, Ekaterina Loukovnikova, Sergei Ostanin, Alexandra Zinchuk, Ekaterina Nikoleva. Test Generation for Single and Multiple Stuck-at Faults of a Combinational Circuit Designed by Covering Shared ROBDD with CLBs. In Cristiana Bolchini, Yong-Bin Kim, Adelio Salsano, Nur A. Touba, editors, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy. pages 206-214, IEEE Computer Society, 2007. [doi]

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