Anjela Matrosova, Ekaterina Loukovnikova, Sergei Ostanin, Alexandra Zinchuk, Ekaterina Nikoleva. Test Generation for Single and Multiple Stuck-at Faults of a Combinational Circuit Designed by Covering Shared ROBDD with CLBs. In Cristiana Bolchini, Yong-Bin Kim, Adelio Salsano, Nur A. Touba, editors, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy. pages 206-214, IEEE Computer Society, 2007. [doi]
@inproceedings{MatrosovaLOZN07,
title = {Test Generation for Single and Multiple Stuck-at Faults of a Combinational Circuit Designed by Covering Shared ROBDD with CLBs},
author = {Anjela Matrosova and Ekaterina Loukovnikova and Sergei Ostanin and Alexandra Zinchuk and Ekaterina Nikoleva},
year = {2007},
doi = {10.1109/DFT.2007.42},
url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2007.42},
tags = {testing},
researchr = {https://researchr.org/publication/MatrosovaLOZN07},
cites = {0},
citedby = {0},
pages = {206-214},
booktitle = {22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 26-28 September 2007, Rome, Italy},
editor = {Cristiana Bolchini and Yong-Bin Kim and Adelio Salsano and Nur A. Touba},
publisher = {IEEE Computer Society},
isbn = {0-7695-2885-6},
}