Anzhela Matrosova, Eugeniy Mitrofanov, Toral Shah. Multiple stuck-at fault testability of a combinational circuit derived by covering ROBDD nodes by Invert-And-Or sub-circuits. In 2015 IEEE East-West Design & Test Symposium, EWDTS 2015, Batumi, Georgia, September 26-29, 2015. pages 1-4, IEEE Computer Society, 2015. [doi]
@inproceedings{MatrosovaMS15-0,
title = {Multiple stuck-at fault testability of a combinational circuit derived by covering ROBDD nodes by Invert-And-Or sub-circuits},
author = {Anzhela Matrosova and Eugeniy Mitrofanov and Toral Shah},
year = {2015},
doi = {10.1109/EWDTS.2015.7493099},
url = {http://doi.ieeecomputersociety.org/10.1109/EWDTS.2015.7493099},
researchr = {https://researchr.org/publication/MatrosovaMS15-0},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2015 IEEE East-West Design & Test Symposium, EWDTS 2015, Batumi, Georgia, September 26-29, 2015},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-7776-8},
}