The following publications are possibly variants of this publication:
- PDF testability of a combinational circuit derived by covering ROBDD nodes using Invert-And-Or circuitsToral Shah, Anzhela Matrosova, Virendra Singh. vdat 2015: 1-2 [doi]
- Test Generation for Single and Multiple Stuck-at Faults of a Combinational Circuit Designed by Covering Shared ROBDD with CLBsAnjela Matrosova, Ekaterina Loukovnikova, Sergei Ostanin, Alexandra Zinchuk, Ekaterina Nikoleva. dft 2007: 206-214 [doi]
- Multiple Stuck-at Fault Testability Analysis of ROBDD Based Combinational Circuit DesignToral Shah, Anzhela Matrosova, Masahiro Fujita, Virendra Singh. et, 34(1):53-65, 2018. [doi]
- Testing multiple stuck-at faults of ROBDD based combinational circuit designToral Shah, Anzhela Matrosova, Binod Kumar, Masahiro Fujita, Virendra Singh. latw 2017: 1-6 [doi]
- PDFs testing of combinational circuits based on covering ROBDDsAnjela Matrosova, E. Nikolaeva. ewdts 2010: 160-163 [doi]
- Test pattern generation to detect multiple faults in ROBDD based combinational circuitsToral Shah, Anzhela Matrosova, Virendra Singh. iolts 2017: 211-212 [doi]
- PDF testability of the circuits derived by special covering ROBDDs with gatesAnzhela Matrosova, E. Nikolaeva, D. Kudin, Virendra Singh. ewdts 2013: 1-5 [doi]
- ROBDD based path delay fault testable combinational circuit synthesisToral Shah, Virendra Singh, Anzhela Matrosova. ewdts 2016: 1-4 [doi]