Multiple Stuck-at Fault Testability Analysis of ROBDD Based Combinational Circuit Design

Toral Shah, Anzhela Matrosova, Masahiro Fujita, Virendra Singh. Multiple Stuck-at Fault Testability Analysis of ROBDD Based Combinational Circuit Design. J. Electronic Testing, 34(1):53-65, 2018. [doi]

Abstract

Abstract is missing.