Multiple Stuck-at Fault Testability Analysis of ROBDD Based Combinational Circuit Design - researchr publication authors

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Toral Shah, Anzhela Matrosova, Masahiro Fujita, Virendra Singh. Multiple Stuck-at Fault Testability Analysis of ROBDD Based Combinational Circuit Design. J. Electronic Testing, 34(1):53-65, 2018. [doi]

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