Toral Shah, Anzhela Matrosova, Masahiro Fujita, Virendra Singh. Multiple Stuck-at Fault Testability Analysis of ROBDD Based Combinational Circuit Design. J. Electronic Testing, 34(1):53-65, 2018. [doi]
@article{ShahMFS18,
title = {Multiple Stuck-at Fault Testability Analysis of ROBDD Based Combinational Circuit Design},
author = {Toral Shah and Anzhela Matrosova and Masahiro Fujita and Virendra Singh},
year = {2018},
doi = {10.1007/s10836-018-5703-3},
url = {https://doi.org/10.1007/s10836-018-5703-3},
researchr = {https://researchr.org/publication/ShahMFS18},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {34},
number = {1},
pages = {53-65},
}