Multiple Stuck-at Fault Testability Analysis of ROBDD Based Combinational Circuit Design - researchr publication related

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Toral Shah, Anzhela Matrosova, Masahiro Fujita, Virendra Singh. Multiple Stuck-at Fault Testability Analysis of ROBDD Based Combinational Circuit Design. J. Electronic Testing, 34(1):53-65, 2018. [doi]

The following publications are possibly variants of this publication:

Testing multiple stuck-at faults of ROBDD based combinational circuit designToral Shah, Anzhela Matrosova, Binod Kumar, Masahiro Fujita, Virendra Singh. latw 2017: 1-6 [doi]

Test Generation for Single and Multiple Stuck-at Faults of a Combinational Circuit Designed by Covering Shared ROBDD with CLBsAnjela Matrosova, Ekaterina Loukovnikova, Sergei Ostanin, Alexandra Zinchuk, Ekaterina Nikoleva. dft 2007: 206-214 [doi]

Multiple stuck-at fault testability of a combinational circuit derived by covering ROBDD nodes by Invert-And-Or sub-circuitsAnzhela Matrosova, Eugeniy Mitrofanov, Toral Shah. ewdts 2015: 1-4 [doi]

Test pattern generation to detect multiple faults in ROBDD based combinational circuitsToral Shah, Anzhela Matrosova, Virendra Singh. iolts 2017: 211-212 [doi]

ROBDD based path delay fault testable combinational circuit synthesisToral Shah, Virendra Singh, Anzhela Matrosova. ewdts 2016: 1-4 [doi]

PDFs testing of combinational circuits based on covering ROBDDsAnjela Matrosova, E. Nikolaeva. ewdts 2010: 160-163 [doi]

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