Toral Shah, Anzhela Matrosova, Binod Kumar, Masahiro Fujita, Virendra Singh. Testing multiple stuck-at faults of ROBDD based combinational circuit design. In 18th IEEE Latin American Test Symposium, LATS 2017, Bogotá, Colombia, March 13-15, 2017. pages 1-6, IEEE, 2017. [doi]
Abstract is missing.