Toral Shah, Anzhela Matrosova, Virendra Singh. Test pattern generation to detect multiple faults in ROBDD based combinational circuits. In 23rd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2017, Thessaloniki, Greece, July 3-5, 2017. pages 211-212, IEEE, 2017. [doi]
Abstract is missing.