2/Cell Distributed Bulk-Current Sensor and Secure Flush Code Eraser Against Laser Fault Injection Attack on Cryptographic Processor - researchr publication authors

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Kohei Matsuda, Tatsuya Fujii, Natsu Shoji, Takeshi Sugawara, Kazuo Sakiyama, Yu-ichi Hayashi, Makoto Nagata, Noriyuki Miura. 2/Cell Distributed Bulk-Current Sensor and Secure Flush Code Eraser Against Laser Fault Injection Attack on Cryptographic Processor. J. Solid-State Circuits, 53(11):3174-3182, 2018. [doi]

This author has not been identified. Look up 'Kohei Matsuda' in GoogleThis author has not been identified. Look up 'Tatsuya Fujii' in GoogleThis author has not been identified. Look up 'Natsu Shoji' in GoogleThis author has not been identified. Look up 'Takeshi Sugawara' in GoogleThis author has not been identified. Look up 'Kazuo Sakiyama' in GoogleThis author has not been identified. Look up 'Yu-ichi Hayashi' in GoogleThis author has not been identified. Look up 'Makoto Nagata' in GoogleThis author has not been identified. Look up 'Noriyuki Miura' in Google

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