Kohei Matsuda, Tatsuya Fujii, Natsu Shoji, Takeshi Sugawara, Kazuo Sakiyama, Yu-ichi Hayashi, Makoto Nagata, Noriyuki Miura. 2/Cell Distributed Bulk-Current Sensor and Secure Flush Code Eraser Against Laser Fault Injection Attack on Cryptographic Processor. J. Solid-State Circuits, 53(11):3174-3182, 2018. [doi]
@article{MatsudaFSSSHNM18-0,
title = {2/Cell Distributed Bulk-Current Sensor and Secure Flush Code Eraser Against Laser Fault Injection Attack on Cryptographic Processor},
author = {Kohei Matsuda and Tatsuya Fujii and Natsu Shoji and Takeshi Sugawara and Kazuo Sakiyama and Yu-ichi Hayashi and Makoto Nagata and Noriyuki Miura},
year = {2018},
doi = {10.1109/JSSC.2018.2869142},
url = {https://doi.org/10.1109/JSSC.2018.2869142},
researchr = {https://researchr.org/publication/MatsudaFSSSHNM18-0},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {53},
number = {11},
pages = {3174-3182},
}