Toshihiro Matsuda, Yuya Sugiyama, Keita Nohara, Kazuhiro Morita, Hideyuki Iwata, Takashi Ohzone, Takayuki Morishita, Kiyotaka Komoku. A Test Structure for Asymmetry and Orientation Dependence Analysis of CMOSFETs. IEICE Transactions, 91-C(8):1331-1337, 2008. [doi]
Abstract is missing.