Shizunori Matsumoto, Hans Jürgen Mattausch, S. Ooshiro, Y. Tatsumi, Mitiko Miura-Mattausch, Shigetaka Kumashiro, Terufumi Yamaguchi, Kyoji Yamashita, Noriaki Nakayama. Test-circuit-based extraction of inter- and intra-chip MOSFET-performance variations for analog-design reliability. In Proceedings of the IEEE 2001 Custom Integrated Circuits Conference, CICC 2001, San Diego, CA, USA, May 6-9, 2001. pages 357-360, IEEE, 2001. [doi]
@inproceedings{MatsumotoMOTMKY01,
title = {Test-circuit-based extraction of inter- and intra-chip MOSFET-performance variations for analog-design reliability},
author = {Shizunori Matsumoto and Hans Jürgen Mattausch and S. Ooshiro and Y. Tatsumi and Mitiko Miura-Mattausch and Shigetaka Kumashiro and Terufumi Yamaguchi and Kyoji Yamashita and Noriaki Nakayama},
year = {2001},
doi = {10.1109/CICC.2001.929801},
url = {https://doi.org/10.1109/CICC.2001.929801},
researchr = {https://researchr.org/publication/MatsumotoMOTMKY01},
cites = {0},
citedby = {0},
pages = {357-360},
booktitle = {Proceedings of the IEEE 2001 Custom Integrated Circuits Conference, CICC 2001, San Diego, CA, USA, May 6-9, 2001},
publisher = {IEEE},
isbn = {0-7803-6591-7},
}