2 Physical Random-Number Generators Based on SiN MOSFET for Secure Smart-Card Application - researchr publication authors

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Mari Matsumoto, Shinichi Yasuda, Ryuji Ohba, Kazutaka Ikegami, Tetsufumi Tanamoto, Shinobu Fujita. 2 Physical Random-Number Generators Based on SiN MOSFET for Secure Smart-Card Application. In 2008 IEEE International Solid-State Circuits Conference, ISSCC 2008, Digest of Technical Papers, San Francisco, CA, USA, February 3-7, 2008. pages 414-415, IEEE, 2008. [doi]

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