Tsubasa Matsuo, Masahiro Inuiguchi, Kenichiro Masunaga. Comparison of Knowledge Acquisition Methods for Dynamic Scheduling of Wafer Test Processes with Unpredictable Testing Errors. JACIII, 19(1):58-66, 2015. [doi]
@article{MatsuoIM15, title = {Comparison of Knowledge Acquisition Methods for Dynamic Scheduling of Wafer Test Processes with Unpredictable Testing Errors}, author = {Tsubasa Matsuo and Masahiro Inuiguchi and Kenichiro Masunaga}, year = {2015}, url = {http://www.fujipress.jp/finder/xslt.php?mode=present&inputfile=JACII001900010008.xml}, researchr = {https://researchr.org/publication/MatsuoIM15}, cites = {0}, citedby = {0}, journal = {JACIII}, volume = {19}, number = {1}, pages = {58-66}, }