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Tsubasa Matsuo, Masahiro Inuiguchi, Kenichiro Masunaga. Comparison of Knowledge Acquisition Methods for Dynamic Scheduling of Wafer Test Processes with Unpredictable Testing Errors. JACIII, 19(1):58-66, 2015. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Dynamic Scheduling Approaches to Wafer Test Scheduling with Unpredictable ErrorTsubasa Matsuo, Masahiro Inuiguchi, Kenichiro Masunaga. jaciii, 17(4):526-534, 2013. [doi]
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