Method of reducing contactor effect when testing high-precision ADCs - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Gwenolé Maugard, Carsten Wegener, Tom O Dwyer, Michael Peter Kennedy. Method of reducing contactor effect when testing high-precision ADCs. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 210-217, IEEE Computer Society, 2003. [doi]

This author has not been identified. Look up 'Gwenolé Maugard' in GoogleThis author has not been identified. Look up 'Carsten Wegener' in GoogleThis author has not been identified. Look up 'Tom O Dwyer' in GoogleThis author has not been identified. Look up 'Michael Peter Kennedy' in Google

runs on WebDSL