Gwenolé Maugard, Carsten Wegener, Tom O Dwyer, Michael Peter Kennedy. Method of reducing contactor effect when testing high-precision ADCs. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 210-217, IEEE Computer Society, 2003. [doi]
@inproceedings{MaugardWOK03,
title = {Method of reducing contactor effect when testing high-precision ADCs},
author = {Gwenolé Maugard and Carsten Wegener and Tom O Dwyer and Michael Peter Kennedy},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20630210abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/MaugardWOK03},
cites = {0},
citedby = {0},
pages = {210-217},
booktitle = {Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA},
publisher = {IEEE Computer Society},
isbn = {0-7803-8106-8},
}