Gwenolé Maugard, Carsten Wegener, Tom O Dwyer, Michael Peter Kennedy. Method of reducing contactor effect when testing high-precision ADCs. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 210-217, IEEE Computer Society, 2003. [doi]
Abstract is missing.