IoT security assessment through the interfaces P-SCAN test bench platform - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Thomas Maurin, Laurent-Frederic Ducreux, George Caraiman, Philippe Sissoko. IoT security assessment through the interfaces P-SCAN test bench platform. In 2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018. pages 1007-1008, IEEE, 2018. [doi]

This author has not been identified. Look up 'Thomas Maurin' in GoogleThis author has not been identified. Look up 'Laurent-Frederic Ducreux' in GoogleThis author has not been identified. Look up 'George Caraiman' in GoogleThis author has not been identified. Look up 'Philippe Sissoko' in Google

runs on WebDSL