IoT security assessment through the interfaces P-SCAN test bench platform

Thomas Maurin, Laurent-Frederic Ducreux, George Caraiman, Philippe Sissoko. IoT security assessment through the interfaces P-SCAN test bench platform. In 2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018. pages 1007-1008, IEEE, 2018. [doi]

@inproceedings{MaurinDCS18,
  title = {IoT security assessment through the interfaces P-SCAN test bench platform},
  author = {Thomas Maurin and Laurent-Frederic Ducreux and George Caraiman and Philippe Sissoko},
  year = {2018},
  doi = {10.23919/DATE.2018.8342159},
  url = {https://doi.org/10.23919/DATE.2018.8342159},
  researchr = {https://researchr.org/publication/MaurinDCS18},
  cites = {0},
  citedby = {0},
  pages = {1007-1008},
  booktitle = {2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018},
  publisher = {IEEE},
  isbn = {978-3-9819263-0-9},
}