P.-D. Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, B. Godard, G. Festes, L. Vachez. A two-layer SPICE model of the ATMEL TSTAC:::TM::: eFlash memory technology for defect injection and faulty behavior prediction. In 15th European Test Symposium (ETS 2010), May 24-28, 2010, Prague, Czech Republic. pages 81-86, IEEE Computer Society, 2010. [doi]
Abstract is missing.